KUONGORORA UYE PACKAGE YEZW SERIES WELDING DIODE
Nzira dzekuyedza nemitemo yekuongorora
1. Batch by batch inspection (Boka A kuongorora)
Batch rimwe nerimwe rezvigadzirwa zvinofanirwa kuongororwa zvinoenderana neTafura 1, uye zvinhu zvese zviri muTable 1 hazviparadze.
Tafura 1 Kuongorora paBatch
| Group | InspectionItem | Inspection Method | Criterion | AQL (Ⅱ) |
| A1 | Chitarisiko | Kuongororwa kwekuona (pasi pemwenje yakajairika uye mamiriro ekuona) | Chiratidzo chakajeka, kupeta kwepamusoro uye plating haina kupepeta uye kukuvadza. | 1.5 |
| A2a | Electrical Characteristics | 4.1(25℃), 4.4.3(25℃) muJB/T 7624—1994 | Polarity yakadzoserwa:VFM>10USL IRRM>100USL | 0.65 |
| A2b | VFM | 4.1(25℃) muJB/T 7624—1994 | Kunyunyuta kune zvinodiwa | 1.0 |
| IRRM | 4.4.3 (25℃,170℃) muJB/T 7624—1994 | Kunyunyuta kune zvinodiwa | ||
| Cherechedza: USL ndiyo inogumira kukosha. | ||||
2. Periodic inspection (Boka B uye Boka C kuongorora)
Sekureva kweTafura 2, zvigadzirwa zvakapedzwa mukugadzirwa kwakajairwa zvinofanirwa kuongororwa kanenge batch rimwe chete reBoka B neBoka C gore rega rega, uye zvinhu zvekuongorora zvakanyorwa ne (D) bvunzo dzinoparadza.Kana kuongorora kwekutanga kusina kukodzera, mamwe sampling anogona kuongororwa zvakare maererano neAppendix Table A.2, asi kamwe chete.
Tafura 2 Periodic Inspection (Boka B)
| Group | InspectionItem | Inspection Method | Criterion | Sampling Plan | |
| n | Ac | ||||
| B5 | Temperature cycling (D) inoteverwa nekuvharwa |
| Kuyera mushure mekuedzwa:VFM≤1.1USL IRRM≤2USL kwete kuvuza | 6 | 1 |
| CRRL | Muchidimbu ipai maitiro akakodzera eboka rega rega, iyo VFM uye IRRMkukosha pamberi uye mushure mekuedzwa, uye mhedzisiro yebvunzo. | ||||
3. Chiziviso chekuongorora (boka D kuongorora)
Kana chigadzirwa chapedzwa uye chaiswa muyedzo yekugadzira, kuwedzera kune A, B, C kuongororwa kweboka, bvunzo dzeboka D dzinofanirawo kuitwa zvinoenderana neTafura 3, uye zvinhu zvekuongorora zvakanyorwa ne (D) bvunzo dzinoparadza.Kugadzirwa kwakajairika kwezvigadzirwa zvakapedzwa kunoedzwa kanenge batch rimwe reBoka D pamakore matatu ega ega.
Kana kuongorora kwekutanga kukatadza, mamwe sampling anogona kuongororwa zvakare zvinoenderana neAppendix Table A.2, asi kamwe chete.
Tafura 3 Identification Test
| No | Group | InspectionItem | Inspection Method | Criterion | Sampling Plan | |
| n | Ac | |||||
| 1 | D2 | Thermal cycle load test | Kutenderera nguva: 5000 | Kuyera mushure mekuedzwa: VFM≤1.1USL IRRM≤2USL | 6 | 1 |
| 2 | D3 | Kuvhunduka kana kudedera | 100g: bata 6ms, hafu-sine waveform, nzira mbiri dze 3 perpendicular axes, 3 nguva munzira imwe neimwe, yakazara ka18.20g: 100 ~ 2000Hz, 2h yenzira imwe neimwe, yakazara 6h. | Kuyera mushure mebvunzo: VFM≤1.1USL IRRM≤2USL | 6 | 1 |
| CRRL | Muchidimbu ipai data rakakodzera reboka rega rega, iyo VFM , IRRMuye IDRMkukosha pamberi uye mushure mekuedzwa, uye mhedzisiro yebvunzo. | |||||
Kumaka uye Packaging
1. Maka
1.1 Maka pane chigadzirwa sanganisira
1.1.1 Nhamba yechigadzirwa
1.1.2 Terminal chitupa chiratidzo
1.1.3 Zita rekambani kana mucherechedzo
1.1.4 Kodhi yekuongorora nzvimbo
1.2 Logo pakatoni kana yakanamatira rairo
1.2.1 Modhi yechigadzirwa uye nhamba yakajairika
1.2.2 Zita rekambani nelogo
1.2.3 Zviratidzo zvinodzivirira hunyoro uye kusanaya kwemvura
1.3 Package
Chigadzirwa chekurongedza zvinodiwa zvinofanirwa kuenderana nemirairo yemumba kana zvinodiwa nevatengi
1.4 Chigadzirwa gwaro
Iyo yechigadzirwa modhi, yekumisikidza chiyero nhamba, yakakosha magetsi ekuita zvinodiwa, kutaridzika, nezvimwe zvinofanirwa kutaurwa pagwaro.
Thewelding diodeinogadzirwa naJiangsu Yangjie Runau Semiconductor inoshandiswa zvakanyanya mukupikisa welder, yepakati uye yakakwirira frequency welding muchina unosvika 2000Hz kana pamusoro.Iine Ultra-yakaderera mberi peak voltage, Ultra-yakaderera kupisa kwekushisa, mamiriro ekugadzira tekinoroji, kugona kutsiva kwakanakisa uye kuita kwakagadzikana kwevashandisi vepasirese, iyo welding diode kubva kuJiangsu Yangjie Runau Semiconductor ndiyo imwe yeakavimbika mudziyo wemagetsi eChina. semiconductor zvigadzirwa.